Microscopy of Semiconducting Materials
by Unknown
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Opis książki
The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.
Szczegóły książki
Autor
Unknown
Wydawnictwo
Springer Berlin
Rok wydania
2006
ISBN
9783540319153
Dostępne formaty
eBook (PDF, EPUB)
Audiobook (MP3)
Język
Polski